NXP

Profile: Software
Selection Process: Test (online), Personal Interview

Pattern of the Test

The test pattern consisted of a variety of topics, including Op-amps, MOSFETs, small signal analysis, and transistors. The assessment format included 30 multiple-choice questions (MCQs), 3 subjective questions, and 1 diagram-related question, focusing on both embedded software and hardware concepts.

Technical Interview

Technical Concepts:

  • Questions from the test related to Op-amps, MOSFETs, and mirror circuits.
  • Specific inquiries about the astable multivibrator project.
  • Equipment availability in the lab and operational voltage conditions for MOSFET saturation.
  • Understanding of basic formulas, such as VGS−VTOV_{GS} – V_{TO}, and characteristics of Op-Amps.

Embedded Programming:

  • Discussion of MOSFETs acting as switches and implementation of AND gates using diodes.
  • Differences between latches and flip-flops (FFs), as well as NAND/NOR gate implementation using CMOS technology.

Digital Design:

  • Topics included digital design principles, CMOS, Static Timing Analysis (STA), and embedded systems.

Software and Resume Discussion:

  • Questions on Object-Oriented Programming (OOP), Software Engineering principles, and tools like Power BI.
  • Additional inquiries related to the candidate’s resume and experiences.